Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection

Improved Bus-con ict Detection J.Th. van der Linden M.H. Konijnenburg A.J. van de Goor Faculty of Information Technology and Systems Delft University of Technology, Delft, The Netherlands [email protected] Abstract Test Pattern Generation (TPG) for sequential and/or 3-state circuits involves two important aspects which often are handled incorrectly: Bus con ict detection and completeness of search in TPG. The correct handling of both aspects strongly depends on the signal model used by TPG. We propose a novel, set-based, signal model using the power-set (i.e., the set of all possible subsets) of the basic values f0 ; 1 ; Zg. TPG using this signal model guarantees complete search, provides exact bus-con ict detection, and is more e cient than TPG using the traditional signal models for 3-state and sequential circuits. Experimental results demonstrate this by higher fault e ciencies combined with a large reduction of backtracking and computing time for sequential ISCAS'89 and industrial circuits.